Work

True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive Forces

Year: 1993

Type: article

Source: Science

DOI: 10.1126/science.260.5113.1451

Authors: F. Ohnesorge, G. Binnig

Institution: IBM (United States)

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2018691623

FWCI: 35.14

Cites: 30

Cited by: 707

Related to: 9