Work

Quantitative Electron Holography of Biased Semiconductor Devices

Year: 2002

Type: article

Source: Physical Review Letters

DOI: 10.1103/physrevlett.88.238302

Authors: A. C. Twitchett, R. E. Dunin-Borkowski, P. A. Midgley

Institution: University of Cambridge

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W2018924534

FWCI: 8.186

Cites: 13

Cited by: 191

Related to: 10