Work

Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges

Year: 1997

Type: article

Source: Science

DOI: 10.1126/science.276.5312.579

Authors: M. J. Yoo, T. A. Fulton, H. F. Hess, R. L. Willett, L. N. Dunkleberger, R. J. Chichester, L. N. Pfeiffer, K. W. West

Institution: Alcatel-Lucent (France)

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2019176261

FWCI: 16.38

Cites: 12

Cited by: 326

Related to: 10