Work

Tomographic image alignment in three-dimensional coherent diffraction microscopy

Year: 2009

Type: article

Source: Physical Review B

DOI: 10.1103/physrevb.79.052102

Authors: Chien-Chun Chen, Jianwei Miao, T. K. Lee

Institutions: Institute of Physics, Academia Sinica, California NanoSystems Institute, University of California, Los Angeles

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2019325439

FWCI: 1.935

Cites: 30

Cited by: 12

Related to: 10