Deep-reasoning fault diagnosis: an aid and a model
Year: 1988
Type: article
DOI: 10.1109/21.17383
Authors: Wan Chui Yoon, J.M. Hammer
Institution: Georgia Institute of Technology
Language: English
Subfield: Human Factors and Ergonomics
Field: Social Sciences
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W2019773630
