In-Situ Dual-Wavelength Ellipsometry and Light Scattering Monitoring of Si/Si1−xGex Heterostructures and Multiuantum Wells
Year: 1993
Type: article
Source: MRS Proceedings
DOI: 10.1557/proc-324-53
Authors: C. Pickering, D.A.O. Hope, W.Y. Leong, D.J. Robbins, R. Greef
Institution: University of Southampton
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2019978148