Work

Structure of pyrolytic and sputtered SiO2 films by X-ray Fourier analysis

Year: 1970

Type: article

Source: physica status solidi (a)

DOI: 10.1002/pssa.19700020117

Authors: S. C. H. Lin, M. Joshi

Institution: IBM (United States)

Language: English

Topic: Glass properties and applications

Subfield: Ceramics and Composites

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2020792223

FWCI: 1.169

Cites: 12

Cited by: 6

Related to: 10