Work

How to measure patent thickets—A novel approach

Year: 2010

Type: article

Source: Economics Letters

DOI: 10.1016/j.econlet.2010.12.005

Authors: Georg von Graevenitz, Stefan Wagner, Dietmar Harhoff

Institutions: Ludwig-Maximilians-Universität München, European School of Management and Technology, Centre for Economic Policy Research

Language: English

Topic: Intellectual Property and Patents

Subfield: Management of Technology and Innovation

Field: Business, Management and Accounting

Domain: Social Sciences

SDG: Industry, innovation and infrastructure

Open Access status: green

Funder: Cisco Systems

OpenAlex ID: W2020931182

FWCI: 18.04

Cites: 18

Cited by: 168

Related to: 10