Work

Defects in epitaxial multilayers I. Misfit dislocations

Year: 1974

Type: article

Source: Journal of Crystal Growth

DOI: 10.1016/0022-0248(74)90424-2

Author: J Matthews

Institution: IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2021684974

FWCI: 2.958

Cites: 8

Cited by: 3,141

Related to: 10