Interface traps density of anodic porous alumina films of different thicknesses on Si
Work
Year: 2005
Type: article
Abstract: Impedance Spectroscopy was employed in order to investigate the electrical properties of thin porous anodic alumina films on Si, of thicknesses in the range of 50-200 nm, fabricated by anodization in ... more
Authors Μαρία Θεοδωροπούλου, P. K. Karahaliou, S. N. Georga, C. A. Krontiras, M. N. Pisanias +2 more
Cites: 9
Cited by: 8
Related to: 10
FWCI: 0.365
Citation percentile (by year/subfield): 57.41
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: gold