An introduction to fault tree analysis with emphasis on failure rate evaluation
Year: 1975
Type: article
Source: Microelectronics Reliability
Author: G.W.E. Nieuwhof
Institution: Atomic Energy (Canada)
Language: English
Topic: Risk and Safety Analysis
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2022253568