Work

Soft X-ray photoemission measurement of Schottky barrier formation at the PdSi interface

Year: 1983

Type: article

Source: Thin Solid Films

DOI: 10.1016/0040-6090(83)90574-6

Authors: R. Purtell, P.S. Ho, G.W. Rubloff, G. Holinger

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2022859289

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