Work

A multiprocess performance analysis chart based on the incapability index Cpp: an application to the chip resistors

Year: 2002

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/s0026-2714(02)00071-9

Authors: W.L Pearn, C.H Ko, K.H Wang

Institutions: National Yang Ming Chiao Tung University, National Chung Hsing University

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2023636019

FWCI: 4.251

Cites: 6

Cited by: 17

Related to: 10