Work

Alpha-particle-induced soft errors in dynamic memories

Year: 1979

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/t-ed.1979.19370

Authors: T.C. May, M.H. Woods

Institution: Intel (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2023856022

FWCI: 37.33

Cites: 8

Cited by: 877

Related to: 10