Work

Characterization of oxide film on titanium by scanning tunneling microscopy/spectroscopy: Influence of the tip composition

Year: 1991

Type: article

Source: Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

DOI: 10.1116/1.585217

Authors: M. Jobin, R. Emch, F. Zenhausern, S. Steinemann, P. Descouts

Institution: University of Geneva

Language: English

Topic: Surface and Thin Film Phenomena

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: AO Foundation

OpenAlex ID: W2023866158

FWCI: 1.371

Cites:

Cited by: 17

Related to: 10