Work

Characterization of Stress in Thallium Bromide Devices

Year: 2015

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2015.2400396

Authors: Amlan Datta, Shariar Motakef

Institution: CapeSym (United States)

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2023956847

FWCI: 1.447

Cites: 14

Cited by: 11

Related to: 10