Inverse scattering for near-field microscopy
Year: 2000
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.1320844
Authors: P. Scott Carney, John C. Schotland
Institution: Washington University in St. Louis
Language: English
Subfield: Mathematical Physics
Field: Mathematics
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2024086741