Work

X-ray, EUV, UV, and optical quantum efficiency measurements of laser-annealed ion-implanted CCDs

Year: 1993

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.162842

Authors: Robert A. Stern, Lawrence Shing, Morley M. Blouke

Institutions: Lockheed (United States), Tektronix (United States)

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Aeronautics and Space Administration

OpenAlex ID: W2024155939

FWCI: 1.41

Cites:

Cited by: 1

Related to: 10