Work

AFM in surface finishing: Part IV. Force–distance curves

Year: 2005

Type: article

Source: Transactions of the IMF

DOI: 10.1179/002029605x38979

Authors: J. R. Smith, S. Breakspear, R. J. R. Fletcher, S. A. Campbell

Institution: Kao Corporation (Japan)

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2024550024

FWCI:

Cites: 23

Cited by: 9

Related to: 10