Work

Phase imaging with intermodulation atomic force microscopy

Year: 2010

Type: article

Source: Ultramicroscopy

Authors: Daniel Platz, Erik A. Tholén, Carsten Hutter, Arndt C. von Bieren, David B. Haviland

Institutions: KTH Royal Institute of Technology, Stockholm University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2024874626

FWCI: 1.556

Cites: 19

Cited by: 22

Related to: 10