Work

Transient stress, rater bias, and Rorschach interpretation

Year: 1973

Type: article

Source: Journal of Clinical Psychology

DOI: 10.1002/1097-4679(197307)29:3<345::aid-jclp2270290318>3.0.co;2-1

Author: David B. Cohen

Institution: The University of Texas at Austin

Language: English

Topic: Psychological Testing and Assessment

Subfield: Applied Psychology

Field: Psychology

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2024939409

FWCI: 2.544

Cites: 9

Cited by: 3

Related to: 10