Work

In Situ Synchrotron X-Ray Diffraction Investigation of the Fast Recovery of Microstructure during Electropulse Treatment of Heavily Cold Drawn Nanocrystalline Ni-Ti Wires

Year: 2011

Type: article

Source: Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena

DOI: 10.4028/www.scientific.net/ssp.172-174.1243

Authors: Benoît Malard, Jan Pilch, Petr Sittner, Remi Delville, Caroline Curfs

Institutions: Czech Academy of Sciences, University of Antwerp, European Synchrotron Radiation Facility

Language: English

Topic: Shape Memory Alloy Transformations

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2025479135

FWCI:

Cites: 10

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Related to: 10