Low-voltage hot-electron currents and degradation in deep-submicrometer MOSFETs
Year: 1990
Type: article
DOI: 10.1109/16.55752
Authors: J.E. Chung, M.-C. Jeng, J.E. Moon, P.-K. Ko, C. Hu
Institution: University of California, Berkeley
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2025966285