Work

Mass-producible microtags for security applications: Tolerance analysis by rigorous coupled-wave analysis

Year: 1997

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.271224

Authors: Michael R. Descour, William C. Sweatt, Avijit K. Ray-Chaudhuri, Kevin D. Krenz, Daniel A. Tichenor, Richard H. Stulen

Institutions: University of Arizona, Sandia National Laboratories California, Sandia National Laboratories

Language: English

Topic: Optical Coatings and Gratings

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2026512337

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