Work

On the role of scattering by surface roughness in silicon inversion layers

Year: 1973

Type: article

Source: Surface Science

DOI: 10.1016/0039-6028(73)90038-1

Authors: Y.C. Cheng, E.A. Sullivan

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2027496334

FWCI: 9.331

Cites: 23

Cited by: 166

Related to: 10