Work

Current noise due to generation and recombination of carriers in forward-biased p-n junctions

Year: 1991

Type: article

Source: Solid-State Electronics

DOI: 10.1016/0038-1101(91)90182-x

Authors: Yisong Dai, Hexin Chen

Institution: Jilin University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2027669761

FWCI: 0.464

Cites: 10

Cited by: 11

Related to: 10