Work

Comments on "Hall Effect Imaging" [with reply]

Year: 1998

Type: article

Source: IEEE Transactions on Biomedical Engineering

DOI: 10.1109/10.720207

Authors: B.J. Roth, J.P. Wikswo, Han Wen, R.S. Balaban

Institution: Vanderbilt University

Language: English

Topic: Electrical and Bioimpedance Tomography

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2028364848

FWCI: 0.487

Cites: 5

Cited by: 19

Related to: 10