Work

In Situ Plane-View and Cross-Sectional Transmission Electron Microscopy of Fractal Formation in Au/a-Ge Bilayer Films

Year: 2002

Type: article

Source: Chinese Physics Letters

DOI: 10.1088/0256-307x/19/6/326

Authors: Zhang Shu-Yuan, Pan Deng-Yu, Wu Zi-Qin

Institution: University of Science and Technology of China

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2028749809

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Cites: 10

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Related to: 10