Work

Considerations for a soft x-ray spectromicroscopy beamline

Year: 1996

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.259854

Authors: Barry L. Winn, X. Hao, Chris J. Jacobsen, Janos Kirz, J. Miao, Sue Wirick, Harald Ade, Christopher J. Buckley, Malcolm R. Howells, Steven L. Hulbert, Ian McNulty, Tom Oversluizen

Institutions: Stony Brook University, North Carolina State University, King's College London, Lawrence Berkeley National Laboratory, Brookhaven National Laboratory, Argonne National Laboratory

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2028982254

FWCI:

Cites: 13

Cited by: 2

Related to: 10