Work

Scanning polarization force microscopy: A technique for imaging liquids and weakly adsorbed layers

Year: 1995

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.114541

Authors: Jun Hu, Xu-Dong Xiao, Miquel Salmeron

Institutions: Lawrence Berkeley National Laboratory, University of California, Berkeley

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2030427403

FWCI: 3.492

Cites: 1

Cited by: 229

Related to: 10