Work

X-Ray Fluorescence Emission Tomography (XFET) With Novel Imaging Geometries— A Monte Carlo Study

Year: 2011

Type: article

Abstract: This paper presents a feasibility study for using two new imaging geometries for synchrotron X-ray fluorescence emission tomography (XFET) applications. In the proposed approaches, the object is illuminated with synchrotron X-ray beams of various cross-sectional dimensions. The resultant fluorescence photons are detected by high-resolution imaging-spectrometers coupled to collimation apertures. To verify the performance benefits of the proposed methods over the conventional line-by-line scanning approach, we have used both Monte Carlo simulations and an analytical system performance index to compare several different imaging geometries. This study has demonstrated that the proposed XFET approach could lead to a greatly improved imaging speed, which is critical for making XFET a practical imaging modality for a wide range of applications.

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2011.2167632

Authors: Ling Jian Meng, Nan Li, Patrick J. La Riviere

Institutions: University of Illinois Urbana-Champaign, University of Chicago

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

Funders: National Cancer Institute, National Institute of Biomedical Imaging and Bioengineering

Awards: G161264334, G4685236192, G6386287937