Measurement of optical properties of highly doped silicon by terahertz time domain reflection spectroscopy
Year: 2001
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.1413498
Authors: S. Nashima, O. Morikawa, K. Takata, M. Hangyo
Institution: The University of Osaka
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2031689101