Work

In situ transmission electron microscopy analysis of conductive filament during solid electrolyte resistance switching

Year: 2011

Type: article

Abstract: An in situ transmission electron microscopy (TEM) analysis of a solid electrolyte, Cu–GeS, during resistance switching is reported. Real-time observations of the filament formation and disappearance process were performed in the TEM instrument and the conductive-filament-formation model was confirmed experimentally. Narrow conductive filaments were formed corresponding to resistance switching from high- to low-resistance states. When the resistance changed to high-resistance state, the filament disappeared. It was also confirmed by use of selected area diffractometry and energy-dispersive x-ray spectroscopy that the conductive filament was made of nanocrystals composed mainly of Cu.

Source: Applied Physics Letters

DOI: 10.1063/1.3593494

Authors: Takashi Fujii, Masashi Arita, Yasuo Takahashi, Ichiro Fujiwara

Institutions: Hokkaido University, Semiconductor Technology Academic Research Center (Japan)

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: bronze

Funders: Hokkaido University, Japan Society for the Promotion of Science

Award: Development of in-situ TEM measurement system and its application to nanoelectronics