Work

Inspection of low-density polyethylene using near-infrared imaging

Year: 1995

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.204863

Authors: Michael W. Jones, James M. Chandler, Steven Bernstein

Institution: AT&T (United States)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2032812073

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