Work

Scanning force microscope study of detachment of nanometer adhering particulates

Year: 2000

Type: article

Source: Materials Science and Engineering A

DOI: 10.1016/s0921-5093(00)00866-2

Authors: J.T. Dickinson, R.F. Hariadi, L. Scudiero, S.C. Langford

Institution: Washington State University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W2034028187

FWCI:

Cites: 9

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Related to: 10