Work

Statistical Mechanics and Pattern Recognition: A New Feedback Technique

Year: 1989

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.960457

Authors: Martin L. Brady, Raghu Raghavan, Joseph Slawny

Institutions: Lockheed (United States), Virginia Tech

Language: English

Topic: Neural Networks and Applications

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2034476209

FWCI: 0.305

Cites:

Cited by: 1

Related to: 10