Work

Toward Electronic Conductance Characterization of DNA Nucleotide Bases

Year: 2007

Type: article

Source: Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena

DOI: 10.4028/www.scientific.net/ssp.121-123.1387

Authors: Predrag S. Krstić, Jack C. Wells, Miguel Fuentes-Cabrera, Dong Xu, James Weifu Lee

Institutions: Oak Ridge National Laboratory, University of Missouri

Language: English

Topic: Molecular Junctions and Nanostructures

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2034620107

FWCI: 0.945

Cites:

Cited by: 7

Related to: 10