An in Situ Study of Mesostructured CTAB−Silica Film Formation during Dip Coating Using Time-Resolved SAXS and Interferometry Measurements
Year: 2002
Type: article
Source: Chemistry of Materials
DOI: 10.1021/cm011255u
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2034628167
