Work

Short-circuit capability of 1200V SiC MOSFET and JFET for fault protection

Year: 2013

Type: conference-paper

Source: Conference proceedings/Conference proceedings - IEEE Applied Power Electronics Conference and Exposition

DOI: 10.1109/apec.2013.6520207

Authors: Xing Huang, Gangyao Wang, Yingshuang Li, Alex Q. Huang, B. Jayant Baliga

Institution: North Carolina State University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2034628329

FWCI: 20.3

Cites: 9

Cited by: 113

Related to: 10