Effects of atmospheric neutrons and natural contamination on advanced microelectronic memories
Year: 2008
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.2971203
Authors: F. Wrobel, J. Gasiot, F. Saigné, A. D. Touboul
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2035651626