Work

Total pattern fitting for the combined size–strain–stress–texture determination in thin film diffraction

Year: 2009

Type: article

Source: Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

DOI: 10.1016/j.nimb.2009.09.053

Author: Luca Lutterotti

Institution: University of Trento

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2035695694

FWCI: 8.447

Cites: 26

Cited by: 1,124

Related to: 10