Advanced interferometric profile measurements through refractive media
Year: 2008
Type: article
Source: Review of Scientific Instruments
DOI: 10.1063/1.2979006
Authors: Stephan T. Koev, Reza Ghodssi
Institution: University of Maryland, College Park
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2035842807
