Work

Strain-Induced Polarization Rotation in Epitaxial (001) BiFeO3 Thin Films

Year: 2008

Type: article

Source: Physical Review Letters

DOI: 10.1103/physrevlett.101.107602

Authors: H. W. Jang, S. H. Baek, D. Ortiz, C. M. Folkman, R. R. Das, Y. H. Chu, P. Shafer, J. X. Zhang, S. Choudhury, V. Vaithyanathan, Y. B. Chen, D. A. Felker, M. D. Biegalski, M. S. Rzchowski, X. Q. Pan, D. G. Schlom, L. Q. Chen, R. Ramesh, C. B. Eom

Institutions: University of Wisconsin–Madison, University of California, Berkeley, Pennsylvania State University, University of Michigan, Oak Ridge National Laboratory, Center for Nanophase Materials Sciences, Cornell University

Language: English

Topic: Multiferroics and related materials

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2036046648

FWCI: 6.983

Cites: 17

Cited by: 259

Related to: 9