Simultaneously Model‐Unbiased, Design‐Unbiased Estimation
Year: 2000
Type: article
Source: Biometrics
Authors: Ken Gerow, Charles E. McCulloch
Institutions: University of Wyoming, Cornell University
Language: English
Subfield: Statistics and Probability
Field: Mathematics
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2036300555
