Work

Study of point defects in ns pulsed-laser annealed CuInSe2 thin films

Year: 2012

Type: conference-paper

Source: Conference record of the IEEE Photovoltaic Specialists Conference

DOI: 10.1109/pvsc-vol2.2012.6656702

Authors: A Bhatia, H Meadows, M C Hymas, E M Smith, P J Dale, M A Scarpulla

Institutions: University of Utah, University of Luxembourg

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Université du Luxembourg, Fonds National de la Recherche Luxembourg, Directorate for Computer and Information Science and Engineering

OpenAlex ID: W2037096586

FWCI: 0.81

Cites: 12

Cited by: 2

Related to: 10