Work

Discrete Resistance Switching in Submicrometer Silicon Inversion Layers: Individual Interface Traps and Low-Frequency ( 1f ?) Noise

Year: 1984

Type: article

Source: Physical Review Letters

DOI: 10.1103/physrevlett.52.228

Authors: K. S. Ralls, W. J. Skocpol, L. D. Jackel, R. E. Howard, L. A. Fetter, R. W. Epworth, D. M. Tennant

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2037328774

FWCI: 28.19

Cites: 18

Cited by: 725

Related to: 10