Work

Multilevel dual-channel NAND flash memories with high-speed read and verifying program

Year: 2006

Type: conference-paper

Source: IEEE Nanotechnology Materials and Devices Conference (NMDC)

DOI: 10.1109/nmdc.2006.4388777

Authors: Jae-Ho Kim, Joung-Woo Lee, Kyung-Sik Mun, Tae Whan Kim

Institution: Hanyang University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2038143129

FWCI:

Cites: 8

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Related to: 10