Work

Radiation damage in charge-coupled devices

Year: 2010

Type: article

Source: Radiation and Environmental Biophysics

DOI: 10.1007/s00411-010-0275-3

Author: Niels Bassler

Institution: Aarhus University

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2038535017

FWCI: 0.249

Cites: 10

Cited by: 16

Related to: 10