Consistent Hydrodynamic and Monte‐Carlo Simulationof SiGe HBTs Based on Table Modelsthe Relaxation Times
Year: 1998
Type: article
Abstract: Good agreement between a hydrodynamic and a Monte‐Carlo device model is demonstrated in this paper for an advanced SiGe Heterojunction Bipolar Transistor. This result is based on two principles: 1) Extraction (from the Monte‐Carlo bulk model under homogeneous conditions) of the relaxation times τ at discrete points of the parameter space spanned by the Ge‐content x, doping density N, carrier temperature TC and lattice temperature TL. 2) Modeling of the relaxation times τ(x, TC, TL) by splines.
Source: VLSI design
DOI: 10.1155/1998/49783
Authors: B. Neinhüs, S. Decker, P. Graf, F. M. Bufler, B. Meinerzhagen
Institution: University of Bremen
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
Funders: Siemens, RWTH Aachen University
OpenAlex ID: W2038580101
