Cryogenic scanning probe characterization of semiconductor nanostructures
Year: 1996
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.117801
Institutions: Harvard University, University of California, Santa Barbara
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2038830291